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Nanotechnology Instruments
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GC / MS
The new Agilent 5975C inert gas MSD delivers better MS resolution and the lowest mass deviation for measuring the nanoscale materials with superior sensitivity and spectral integrity. Advanced analysis routines let you get more information from every run, and automated spectral deconvolution, identification, and quantification software simplifies post-run analysis.
| Product |
Quartz Quadrupole |
Trace Ion Detection |
Inert Ion Source |
Microfluidics |
Compatible GC Systems |
5975C
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Yes |
Yes |
Yes |
Yes |
7890A
6890N
6850C |
- Proprietary design gold quartz quadrupole enhances performance and reliability up to 1050 u
- New Trace Ion Detection technology lowers detection limits in complex matrices and enhances baseline reproducibility
- Inert ion source—now programmable up to 350oC—delivers enhanced response for active compounds and late eluters
- Synchronous SIM/Scan mode lets you selectively monitor for ions of interest at high sensitivity while simultaneously acquiring library-searchable scan data
Brochures
5975C
Application Notes
5975C
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