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Instruments for Nanotechnology Research

Materials Science

Nanotechnology is positioned to make new breakthroughs in materials science. The insertion of nanotubes, nanoparticles, and nanowires into fluids, polymers, fabric, and conductive substrates will dramatically change the characteristics of these materials. Agilent’s line of AFM microscopes systems help you image, characterize, and manipulate at the nanoscale. Other lines of instruments help you characterize the chemical, biological, and electrical changes in materials. Combining measurements from multiple disciplines gives you the complete picture of new nano-engineering materials.

Fabric / Fibers

5989-2589EN	Basics of Measuring Dielectric Properties of Materials
5950-3000	Impedance Measurement Handbook
5968-1947E	8 Hints for Successful Impedance Measurements
5965-4792E	Accessories Selection Guide for Impedance Measurements
	... more electronic measurements

Fluids

5989-5916EN	Accurate molecular mass determination by HPLC-ESI-MS-TOF in clinical toxicology
5989-5859EN	Confirmation of Pain Medications in Oral Fluid Using Inert-Source GC/MS
5989-5668EN	Confirmation of THC in Oral Fluids Using High-Resolution 2-D GC/MS
5989-1655EN	Agilent Multiple Affinity Removal Spin Cartridge for Human Serum
5989-0265EN	Removal of Multiple High-Abundant Proteins from Human Serum for Proteomics Sample Preparation
	... more fluids

General

5989-6926EN	Application of Atomic Force Microscopy (AFM) in Polymer Materials
5989-6376EN	Carbon Nanotube Tips for MAC Mode AFM Measurements in Liquids
5989-6515EN	Using Non-Contact AFM to Image Liquid Topographies
5989-6821EN	Manipulation of Gold Nanoparticles in Liquids Using MAC Mode AFM
5989-6626EN	Studies of Polyvinyl Alcohol under Temperature and Humidity Control
5989-6377EN	MAC Mode Atomic Force Microscope for Precision Interfacial Force Measurements
5989-6822EN	Adsorption of Poly(2-vinylpyridine) Wormlike Polyelectrolyte Brushes
5989-6896EN	Probing Polymer Surface Properties with Multiple Imaging Modes
5989-7395EN	Probing the Three-Dimensional Structure of Soft Organized Surfactants at the Solid-Liquid Interface via AFM
5989-7699EN	New Approach to Generate Thiol-terminated SAMs on Gold

Particles

5989-8054EN	Agilent 7020 ZetaProbe Zeta Potential Analyzer Brochure
5989-8052EN	Agilent 7010 Particle Size Spectrophometer Brochure
5989-8050EN	Agilent 7000 Series Particle Analyzers Brochure
5989-8124EN	Basics of Zeta Potential
5989-8123EN	Use of the Agilent 7020 ZetaProbe to control suspension stability
5989-8122EN	Definitive Quality Control of Titania Coatings with the Agilent 7020 ZetaProbe
5989-8051EN	More Reliable, Faster Determination of Isoelectric Point with the Agilent 7020 Zeta Probe

Polymers

5989-3542EN	Agilent 2100 bioanalyzer - Application Compendium
5989-5898EN	Identification of Unknown Reaction By-Products and Contaminants in Epoxyphenolic-Based Food Can Coatings by LC/TOF-MS
5989-2850EN	Determination of polybrominated diphenyl ethers in polymeric materials using the 6890 GC / 5973N-inert MSD with electron impact ionization
5965-9048E	Analysis of Polystyrene using Gel Permeation Chromatography
5966-1873E	Gel Permeation Chromatography for Clean-up of Soil and Sediments using HPLC
5965-9041E	Analysis of Antioxidants and UV Stabilizers in Polymers using HPLC
5988-0116EN	Characterization of light-emitting polymers
	... more polymers

Semiconductors

5988-5947EN	Determination of Trace Metal Impurities in Semiconductor-Grade Hydrogen Peroxide by ICP-MS
5989-4348EN	Determination of Impurities in Semiconductor Grade Hydrochloric Acid Using the Agilent 7500cs ICP-MS
5988-9190EN	Analysis of Impurities in Semiconductor Grade Sulfuric Acid using the Agilent 7500cs ICP-MS
5988-9529EN	Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS
5988-8901EN	Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS
5968-8953E	Trace Anion Determination in Semiconductor Grade by Capillary Electrophoresis
	... more semiconductor chemical analysis
5950-2953	Multifrequency C-V Measurements of Semiconductors (AN 369-5)
5989-2842EN	Measuring CNT FET’s and SET’s Using the B1500A
5989-3608EN	IV and CV Measurements Using the B1500A
5989-5927EN	Using the Agilent B1500A with a Nanoprober to Perform Failure Analysis
5988-5920EN	Evaluation of Gate Oxides Using a Voltage Step Quasi-static CV Method. AN4156-10
	... more electronic measurements

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