Instruments for Nanotechnology Research


 
 
 
Electronics

Electronics

As the world leader in electronic test, Agilent has the complete portfolio of products that can measure from DC to light. Agilent’s industry-leading network analyzers can characterize both high frequency electrical circuits and semiconductor materials. Our world-class semiconductor analyzer can characterize devices such as CNT FET’s and single-electron transistors. Our precision DMM’s can make high resolution nanovolt measurements on nanoscale devices. A complete line of signal sources including function generators, pulse generators, and precision power supplies lets you apply the stimulus needed. Tap into over 65 years of electronic expertise in high-performance measurements.


Memory

5965-5657E Evaluation of Flash Memory Cells. AN4156-4
5989-4991EN Improve Your Time-to-Insight:Debugging Intermittent Memory Failures in DDR and DDR2 Systems
5989-3481EN Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification
5988-9591EN 81133A/81134A 12 Mbit Extended Pattern Memory
8110A How to Generate Real World Signals With the Agilent 8110A (PN 8110A)
  ... more electronic measurements

Semiconductor devices

5988-5947EN Determination of Trace Metal Impurities in Semiconductor-Grade Hydrogen Peroxide by ICP-MS
5989-4348EN Determination of Impurities in Semiconductor Grade Hydrochloric Acid Using the Agilent 7500cs ICP-MS
5988-9190EN Analysis of Impurities in Semiconductor Grade Sulfuric Acid using the Agilent 7500cs ICP-MS
5988-9529EN Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS
5988-8901EN Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS
5968-8953E Trace Anion Determination in Semiconductor Grade by Capillary Electrophoresis
  ... more semiconductor chemical analysis
5950-2953 Multifrequency C-V Measurements of Semiconductors (AN 369-5)
5989-2842EN Measuring CNT FET’s and SET’s Using the B1500A
5989-3608EN IV and CV Measurements Using the B1500A
5989-5927EN Using the Agilent B1500A with a Nanoprober to Perform Failure Analysis
5988-5920EN Evaluation of Gate Oxides Using a Voltage Step Quasi-static CV Method. AN4156-10
  ... more electronic measurements

Sensors

5964-9112E 4073A and Ultra Low Current Measurement Technologies
5988-5512EN Resistance, Current, Frequency, and Period Measurement Errors in DMM’s
5966-1928E Impedance Measurements Using the Agilent 4291B and the Cascade Microtech Prober (PN 4291-3)
5988-3279EN Accurate Impedance Measurement with Cascade Microtech Probe System(AN1369-3)
5968-4506E New Technologies for Accurate Impedance Measurement (40Hz to 110MHz), (PN 4294A)
5950-2367 Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
5950-2949 Optimizing Electronic Component and Material Impedance Measurements (AN 369-1)
  ... more electronic measurements