Instruments for Nanotechnology Research


 
 
 

Atomic Force Microscopes

Agilent Technologies offers a wide range of high-precision atomic force microscopes (AFM) to meet your unique research needs. Agilent's highly configurable instruments allow you to expand the system's capabilities as your needs occur. Agilent's industry-leading environmental/ temperature systems and fluid handling enable superior control for electrochemistry, polymer and life-science applications. Agilent offers a broad array of scanners, from one micron to 90 microns, with top-down scanning that protects electronics and piezo elements from damage caused by liquid or harsh imaging environments. And, Agilent's innovative nose cones make changing imaging modes quick and easy. Agilent delivers exceptional worldwide support, provided by experienced AFM application scientists and technical service personnel, giving you the assistance necessary for your research.

What is an AFM?
User manuals and software
Consumables

AFM Grant Resources

 


Product Sample Size Imaging Modes Temperature Control Environmental Control Applications
NEW
5420 AFM (N9498S)
5420 AFM
20mm x 20mm STM
LFM
EFM
MFM
SMM
KFM
MAC Mode
Contact Mode
Phase Imaging
Current Sensing
Force Modulation
Acoustic AC Mode
Yes No

Electronic Materials
Polymers
Materials Science
Surface characterization
Education

5500 AFM (N9410S)
5500 AFM
20mm x 20mm STM
LFM
EFM
MFM
KFM
MAC Mode
Contact Mode
Phase Imaging
Current Sensing
Force Modulation
Acoustic AC Mode
Yes Yes Electrochemistry
Polymers
Nanolithography
Nanografting
Life Science
Materials Science
NEW
5600LS AFM
5600LS AFM
200mm x 200mm STM
SMM
LFM
EFM
MFM
KFM
MAC Mode
Contact Mode
Phase Imaging
Current Sensing
Force Modulation
Acoustic AC Mode
Yes No Electronic Materials
Semiconductor
Data Storage
Material Science Polymers
5500 ILM AFM (N9435S)
5500 ILM AFM
20mm x 20mm STM
LFM
EFM
MFM
KFM
MAC Mode
Contact Mode
Phase Imaging
Current Sensing
Force Modulation
Acoustic AC Mode
Yes No Life Science
5100 AFM (N9420A)
5100 AFM
20mm x 20mm STM
LFM
KFM
EFM
MFM
MAC Mode
Contact Mode
Phase Imaging
Current Sensing
Force Modulation
Acoustic AC Mode
Yes Yes Electrochemistry
Polymers
Materials Science
5400 AFM (N9490S)
5400 AFM
20mm x 20mm STM
LFM
EFM
MFM
SMM
KFM
MAC Mode
Contact Mode
Phase Imaging
Current Sensing
Force Modulation
Acoustic AC Mode
Yes No Materials Science
Polymers
Surface Characterization
Nanolithography
Education