Instruments for Nanotechnology Research


 
 
 

Network Analyzers

Take advantage of the Agilent’s broad selection of high performance network analyzers to fully characterize your nanoscale devices. Use with the Materials Measurement Software or the Dielectric Probe Kit for interfacing to your nanotechnology-based materials. For more information, see the complete line of Agilent materials test products.


Product Frequency Range Dynamic Range Trace Noise Other Products in the Family
E8361A PNA Network Analyzer
E8361A PNA
10MHz to 67GHz 136 dB < 0.006 dB E8362B PNA Network Analyzer, 10MHz to 20GHz
E8363B PNA Network Analyzer, 10MHz ato 40GHz
E8364B PNA Network Analyzer, 10MHz to 50GHz
E5070B ENA RF Network Analyzer, 300KHZ to 3GHz
N5230A PNA-L Network Analyzer
N5230A PNA L
300 kHz to 50 GHz 79-122 dB < 0.004 dB N5250A Millimeter Wave PNA
E5071C ENA RF Network Analyzer
E5071C ENA RF
9 kHz to8.5 GHz 123 dB < 0.004 dB @70 kHz IFBW E5070B
E5062A ENA-L RF Network Analyzer
E5062A_ENA_L
300 kHz to 3.0 GHz 115 dB < 0.005 dB E5061A ENA-L


Brochures

PNA Network Analyzers
Agilent PNA-L Network Analyzers
Agilent E5071C ENA RF Network Analyzers
Agilent ENA-L RF Network Analyzers
Network Analyzer Selection Guide
Dielectric Probe Kit
Materials Measurement Software
Materials Measurement demo video

Application Notes

Split Post Dielectric Resonators for Dielectric Measurements of Substrates
Applying Error Correction to Network Analyzer Measurements
Understanding and Improving Network Analyzer Dynamic Range
On-Wafer Balanced Component Measurement Using Microtech Cascade Probe System
On-Wafer SOLT Calibration
Basics of Measuring Dielectric Properties of Materials