Semiconductor Device and Parameter Analyzers

The Agilent Semiconductor Device and Parameter Analyzers provide a wide array of parametric measurements on nano-devices such as carbon nanotube field effect transistors (CN-FET) and nanowire transistors. The B1500A Semiconductor Analyzer uses a tasked-oriented approach that simplifies measurement set-up. It comes with EasyExpert software and over 150 application programs for unparalleled flexibility, scalability, and accuracy. The Agilent 4156C* and 4155C* parametric analyzers are a good choice for current users who have already developed their custom algorithms. All products come with a wide variety of source and measure hardware that ensures accurate and repeatable measurements at various performance levels. Optional hardware makes it possible to do both IV and CV measurements with one instrument.

* Requires 4150B expander chassis with HPSMU option.

Product	Maximum Force Voltage	Maximum Force Current	Voltage Resolution	Current Measurement Resolution	PC and Software
B1500A Semiconductor Device Analyzer	200V	1 A	0.5 uV	100 aA	Internal (built-in)
4156C Precision Semiconductor Parameter Analyzer	200V	1 A	0.2 uV	1 fA	External
4155C Semiconductor Parameter Analyzer	200V	1 A	0.2 uV	10 fA	External

Brochures

B1500A Semiconductor Device Analyzer
4156C Precision Semiconductor Parameter Analyzer
4155C Semiconductor Parameter Analyzer

Application Notes

Measuring CNT FET’s and SET’s Using the B1500A
IV and CV Measurements Using the B1500A
Using the Agilent B1500A with a Nanoprober to Perform Failure Analysis