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Agilent Technologies’ Scanning Microwave Microscopy Garners Second Major Innovation Award read more+
Agilent Technologies Announces First Nano Measure Scientific Symposium - Krakow, Poland, to Host 2010 Event read more+
Novelx has Joined Agilent read more+
Agilent Announces the New T150 UTM read more+
Agilent Introduces the New DCM II Module for the G200 & G300 read more+
Agilent Technologies’ SMM Mode Wins R&D 100 Award read more+
Agilent Technologies Introduces NanoSuite 5.0 Software for More Powerful Nanomechanical Testing read more+
Agilent Technologies Enhances Performance of Popular Atomic Force Microscope for Research, Education read more+
Agilent Technologies Expands Capabilities of Highly Versatile read more+
Nanotech 2010February 17-19 Tokyo Japan
Biophysical Society MeetingFebruary 20-24 San Francisco, CA
PITTCONMarch 1-4 Orlando, FL
Semicon ChinaMarch 16-18 Shanghai China
Applied Physics SocietyMarch 17-20 Kanagawa Japan
APSMarch 15-17 Portland, OR
