General

• A magnetically driven oscillating probe microscope for operation in liquids
  Wenhai Han, S. M. Lindsay, Tianwei Jing
  Applied Physics Letters, Volume 69, Issue 26, pp. 4111-4113
• Probing molecular ordering at a liquid-solid interface with a magnetically oscillated atomic force microscope
  Wenhai Han, S. M. Lindsay
  Applied Physics Letters, Volume 72, Issue 13, pp. 1656-1658
• A solution flow system for hydrothermal–electrochemical growth of multilayered thin films
  Wojciech L. Suchanek, Tomoaki Watanabe, Bungo Sakurai, Naoki Kumagai, Masahiro Yoshimura
  Review of Scientific Instruments, Volume 70, Issue 5, pp. 2432-2437
• Manipulation of gold nanoparticles in liquid environments using scanning force microscopy
  R. Resch, D. Lewis, S. Meltzer, N. Montoya, B. E. Koel, A. Madhukar, A. A. G. Requicha and P. Will
  Ultramicroscopy, Volume 82, Issues 1-4, February 2000, Pages 135-139
• A system for performing simultaneous in situ atomic force microscopy/optical microscopy measurements on electrode materials for lithium-ion batteries
  L. Y. Beaulieu, V. K. Cumyn, K. W. Eberman, L. J. Krause, J. R. Dahn
  Review of Scientific Instruments, Volume 72, Issue 8, pp. 3313-3319
• Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors
  Cattien V Nguyen, Kuo-Jen Chao, Ramsey M D Stevens, Lance Delzeit, Alan Cassell, Jie Han, M Meyyappan
  Nanotechnology, 12 (3), p.363-367
• Separation of optical anisotropies by angular dependent reflection anisotropy spectroscopy
  B. F. Macdonald, R. J. Cole
  Applied Physics Letters, Volume 80, Issue 19, pp. 3527-3529
• AFM and STM study of ?-amyloid aggregation on graphite
  Zhigang Wang, Chunqing Zhou, Chen Wang, Lijun Wan, Xiaohong Fang and Chunli Bai
  Ultramicroscopy, Volume 97, Issues 1-4, October-November 2003, Pages 73-79
• Simple test system for single molecule recognition force microscopy
  C.K. Riener, C.M. Stroh, A. Ebner, C. Klampfl, A.A. Gall, C. Romanin, Y.L. Lyubchenko, P. Hinterdorfer, H.J. Gruber
  Analytica Chimica Acta, 479, 1, pp. 59-75
• Calibration of optical cantilever deflection readers
  Zhiyu Hu, Tim Seeley, Sebastian Kossek, Thomas Thundat
  Review of Scientific Instruments, Volume 75, Issue 2, pp. 400-404
• Hydrodynamic damping of a magnetically oscillated cantilever close to a surface
  Christian Rankl, Vasilli Pastushenko, Ferry Kienberger, Cordula M. Stroh and Peter Hinterdorfer
  Ultramicroscopy, Volume 100, Issues 3-4, August 2004, Pages 301-308
• Quantitative characterization of friction coefficient using lateral force microscope in the wearless regime
  P. Bilas, L. Romana, B. Kraus, Y. Bercion, J. L. Mansot
  Review of Scientific Instruments, Volume 75, Issue 2, pp. 415-421
• An alternative isolation of tungsten tips for a scanning tunneling microscope
  E. Abelev, N. Sezin, Y. Ein-Eli
  Review of Scientific Instruments, 76
• Atomic force microscopy of histological sections using a chemical etching method
  B. Tiribilli, D. Bani, F. Quercioli, A. Ghirelli and M. Vassalli
  Ultramicroscopy, Volume 102, Issue 3, February 2005, Pages 227-232
• Cantilever tip probe arrays for simultaneous SECM and AFM analysis
  R.J. Fasching, Y. Tao and F.B. Prinz
  Sensors and Actuators B: Chemical, Volume 108, Issues 1-2, 22 July 2005, Pages 964-972
• Development of a high velocity accessory for atomic force microscopy-based friction measurements
  Ewa Tocha, Tomasz Stefa?ski, Holger Schönherr, G. Julius Vancso
  Review of Scientific Instruments, 76
• Focused ion beam-nanomachined probes for improved electric force microscopy
  Claudia Menozzi, Gian Carlo Gazzadi, Andrea Alessandrini and Paolo Facci
  Ultramicroscopy, Volume 104, Issues 3-4, October 2005, Pages 220-225
• Iterative control of dynamics-coupling-caused errors in piezoscanners during high-speed AFM operation
  Tien, S.; Qingze Zou; Devasia, S.
  Control Systems Technology,Volume 13, Issue 6, Page(s):921 - 931
• Scanning probe microscopes go video rate and beyond
  M. J. Rost, L. Crama, P. Schakel, E. van Tol, G. B. E. M. van Velzen-Williams, C. F. Overgauw, H. ter Horst, Dekker, B. Okhuijsen, M. Seynen, A. Vijftigschild, P. Han, A. J. Katan, K. Schoots, R. Schumm, W. van Loo, T. H. Oosterkamp, J. W. M. Frenken
  Review of Scientific Instruments, May 2005
• An experimental study of the contact mode AFM scanning capability of polyimide cantilever probes
  Angelo Gaitas and Yogesh B. Gianchandani
  Ultramicroscopy, Volume 106, Issues 8-9, June-July 2006, Pages 874-880
• Automated image analysis of atomic force microscopy images of rotavirus particles
  S. Venkataraman, D.P. Allison, H. Qi, J.L. Morrell-Falvey, N.L. Kallewaard, J.E. Crowe, Jr. and M.J. Doktycz
  Ultramicroscopy, Volume 106, Issues 8-9, June-July 2006, Pages 829-837
• Direct force balance method for atomic force microscopy lateral force calibration
  David B. Asay, Seong H. Kim
  Review of Scientific Instruments, 77
• Direct tip-position control using magnetic actuation for achieving fast scanning in tapping mode atomic force microscopy
  G. R. Jayanth, Younkoo Jeong, Chia-Hsiang Menq
  Review of Scientific Instruments, 77
• Direct tip-sample interaction force control for the dynamic mode atomic force microscopy
  Younkoo Jeong, G. R. Jayanth, Sissy M. Jhiang, Chia-Hsiang Menq
  Applied Physics Letters, 88
• Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe
  Osamu Takeuchi, Takaaki Miyakoshi, Atsushi Taninaka, Katsunori Tanaka, Daichi Cho, Machiko Fujita, Satoshi Yasuda, Suzanne P. Jarvis, and Hidemi Shigekawa
  Journal of Applied Physics, 100
• Improving the contrast of topographical AFM images by a simple averaging filter
  F. Kienberger, V.P. Pastushenko, G. Kada, T. Puntheeranurak, L. Chtcheglova, C. Riethmueller, C. Rankl, A. Ebner and P. Hinterdorfer
  Ultramicroscopy, Volume 106, Issues 8-9, June-July 2006, Pages 822-828
• An intercepted feedback mode for light sensitive spectroscopic measurements in atomic force microscopy
  J. Smoliner, W. Brezna
  Review of Scientific Instruments, 78
• Comparative dynamics of magnetically, acoustically, and Brownian motion driven microcantilevers in liquids
  Xin Xu / Arvind Raman
  Journal of Applied Physics, v.102, 2007
• Comparison of different aminofunctionalization strategies for attachment of single antibodies to AFM cantilevers
  Andreas Ebner, Peter Hinterdorfer and Hermann J. Gruber
  Ultramicroscopy, Volume 107, Issues 10-11, October 2007, Pages 922-927
• Frequency response of an atomic force microscope in liquids and air: Magnetic versus acoustic excitation
  Elena T. Herruzo, Ricardo Garcia
  Applied Physics Letters, 91
• Manufacturing and full characterization of silicon carbide-based multi-sensor micro-probes for biomedical applications
  Gemma Gabriel, Ivan Erill, Jaume Caro, Rodrigo Gómez, Dolors Riera, Rosa Villa and Philippe Godignon
  Microelectronics Journal, Volume 38, Issue 3, March 2007, Pages 406-415
• Two color, low intensity photocurrent feedback for local photocurrent spectroscopy
  W. Brezna, G. Strasser, J. Smoliner
  Review of Scientific Instruments, 78
• STM Contrast, Electron-Transfer Chemistry, and Conduction in Molecules
  Han, W.; Durantini, E. N.; Moore, T. A.; Moore, A. L.; Gust, D.; Rez, P.; Leatherman, G.; Seely, G. R.; Tao, N.; Lindsay, S. M.
  The Journal of Physical Chemistry B; 101(50); pp. 10719-10725
• Adhesion Forces Measured by Atomic Force Microscopy in Humid Air
  Sedin, D. L.; Rowlen, K. L.
  Analytical Chemistry; 72(10); pp. 2183-2189
• Nanobubbles and Their Precursor Layer at the Interface of Water Against a Hydrophobic Substrate
  Steitz, R.; Gutberlet, T.; Hauss, T.; Klosgen, B.; Krastev, R.; Schemmel, S.; Simonsen, A. C.; Findenegg, G. H.
  Langmuir; 19(6); pp. 2409-2418
• Resistance measurements at the nanoscale: scanning probe ac impedance spectroscopy
  Anthony Layson, Shailesh Gadad and Dale Teeters
  Electrochimica Acta, Volume 48, Issues 14-16, 30 June 2003, Pages 2207-2213
• A Tutorial on the mechanisms, dynamics, and control of atomic force microscopes
  Daniel Y. Abramovitch, Sean B. Andersson, Lucy Y. Pao, and Georg Schitter
  Proceedings of the 2007 American Control Conference
• Observation of the surface stress induced in microcantilevers by electrochemical redox processes
  F. Tian, J. H. Pei, D. L. Hedden, G. M. Brown and T. Thundat
  Ultramicroscopy, Volume 100, Issues 3-4, August 2004, Pages 217-223
• Tip to substrate distances in STM imaging of biomolecules
  Dario Alliata, Laura Andolfi and Salvatore Cannistraro
  Ultramicroscopy, Volume 101, Issues 2-4, November 2004, Pages 231-240
• The effect of the shape of a tip's apex on the fabrication of an AFM tip with an attached single carbon nanotube
  Hyung Woo Lee, Soo Hyun Kim, Yoon Keun Kwak, Eung Sug Lee and Chang Soo Han
  Sensors and Actuators A: Physical, Volume 125, Issue 1, 21 October 2005, Pages 41-49
• Surface attachment of ligands and receptors for molecular recognition force microscopy
  Peter Hinterdorfer, Hermann J. Gruber, Ferry Kienberger, Gerald Kada, Christian Riener, Cordula Borken and Hansgeorg Schindler
  Colloids and Surfaces B: Biointerfaces, Volume 23, Issues 2-3, February 2002, Pages 115-123
• Atomic force microscopy for the analysis of environmental particles
  Kathryn A. Ramirez-Aguilar, David W. Lehmpuhl, Amy E. Michel, John W. Birks and Kathy L. Rowlen
  Ultramicroscopy, Volume 77, Issues 3-4, July 1999, Pages 187-194
• Two-component atomic force microscopy recognition imaging of complex samples
  H. Wang, R. Bash and D. Lohr
  Analytical Biochemistry, Volume 361, Issue 2, 15 February 2007, Pages 273-279
• Geometric artefact suppressed surface potential measurements
  Minhwan Lee, Wonyoung Lee, Fritz B Prinz
  Nanotechnology, 17 (15), p.3728-3733