Agilent 33250A Function/Arbitrary Waveform Generator
Voltage pulses of 10ns and 100ns were generated with a waveform generator and sent through a phase change memory device. The resulting changes in resistance were measured with a semiconductor parameter analyzer in order to analyze the device's set and reset characteristics. |
|
A nano-scale-sized 3D element for phase change memories
HANGBING LV, YINYIN LIN, PENG ZHOU, TINGAO TANG, BAOWEI QIAO, YUNFENG LAI, JIE FENG, BOMY CHEN
Semiconductor Science and Technology 21, 6/20/2006
Fudan University, China |
United States Home » Industries »
Instruments for Nanotechnology Research »
Products & Services
