Just about the time you think you know every instrument that exists - someone comes up with a new idea. University of Maryland researchers have come up with something they refer to as a dielectric microwave microscope. The combination of a microwave source and a AFM probe allows one to send microwave signals to dielectric material and look at the signals that are reflected back to the probe.
Is this really a microscope? According to the dictionary - a microscope is an optical instrument having a magnifying lens or a combination of lenses for inspecting objects too small to be seen or too small to be seen distinctly and in detail by the unaided eye. So in the true sense, this isn’t a microscope because there are no optics and lenses. However, it does allow one to “view” phenomena that is too small for the naked eye. And I use the term “view” pretty loosely - a chance to better understand and/or characterize an object (or in this case, dielectric material).
From my perspective I think we’re going to see a lot more combinations of traditional instruments to characterize / view new types of materials. I applaud researchers who have found ways to combine different sources and sensors in order to better explain the properties and structures of nano materials. If you would like to share your combination instruments or solicit ideas on combinational instruments - write back to this blog or send me an email (grant_drenkow@agilent.com).
We would love to start a dialog on this subject that might lead to better measurements which in turn leads to breakthrough research and hopefully to products to improve our world. Pretty lofty thoughts - but what you can’t measure … you can’t improve.
To visit examples of unique measurements in the nano world - check out these application examples. http://nano.tm.agilent.com/index.cgi?CONTENT_ID=1361&User:LANGUAGE=en-US
