Agilent at NSTI Nanotech 2007
Friday, May 25, 2007 by Grant DrenkowI just returned from Santa Clara, California and the NSTI Nanotech 2007 Conference. Agilent was a gold level sponsor this year with a booth that showed our breadth of offering with bioanalyzers, dielectric analyzers, semiconductor analyzers, and our new MAC III mode on the atomic force microscopes. In case you missed the show, I inserted a picture of the booth.
Dr. Darlene Solomon, Director of Agilent Labs, gave the keynote speech on Thursday morning. She talked about how measurements enable us to make breakthroughs in technology which in turn helps us develop better products including new measurement instruments–and the cycle repeats. She gave some great examples of measurement breakthroughs that have increased resolution and precision by 10x, 100x, and even 1000x. Nanotechnology is a convergence of electronics, chemistry, biology, and materials science operating at a scale that requires higher resolution measurements. The breakthroughs will be outstanding and the metrology will need to support those breakthroughs. “If you can’t measure it … you can;t improve it.”
The breadth of the work being done in nanotechnology is really amazing. I sat through papers describing new techniques that will help us dramatically reduce the size of semiconductor electronics. I saw keynote speakers talk about some very exciting developments in the area of energy including some very important ways we should increase electrical efficiency. I saw some exciting work being done in disease detection and tissue engineering that will improve our lives in the not too distant future. We are living in exciting times.
For those that attended, what were your impressions? 
