Archive for February 2007

AGILENT NANOTECHNOLOGY BLOG

Monday, February 26, 2007 by Grant Drenkow

Welcome to the Agilent Nanotechnology WebLog. As the premier measurement company we feel it is important for us to start the dialogue around measurements being made in nanotechnology research. We use the word “measurements” in a broad sense to include the imaging, manipulation and characterization of nanoscale devices and structures with microscopy products. We include the sensing and sourcing of electrical signals to characterize nanoscale devices. And we include the chemical and biological analysis of molecules and compounds at the nanoscale. All measurements are fair game – shape, size, hardness, conductance, capacitance, current flow, voltage, chemical make-up, bioanalysis, fluorescence, etc. It’s your choice what we talk about.

It’s an exciting time to be on the leading edge. In basic research you collaborate on projects. You learn together, you share expertise, and you succeed as a team. Why not take this same approach on the measurement side? That’s the focus of this blog – the measurements (in the broad sense) that you need in your nanotechnology projects. It’s the measurements that lead to breakthroughs in nanotechnology which I hope will make a better life for us and our children.

This blog is about measurements made with any instrument. It’s about learning from each other what works and what doesn’t. It’s about success—finding ways to successfully complete nanotechnology projects, whether that be in basic research or the engineering of products for the market. Other web sites and blogs will provide us with information on breakthroughs in nanotechnology research – this blog is all about the nuts and bolts of the measurements that lead to the breakthrough. It’s the HOW and not the WHAT.

I encourage you to sign up, learn from others, and participate by sharing your experience.

Grant Drenkow
Agilent Nanotechnology Program Manager
Grant_drenkow@agilent.com

New High-Performance Beamsplitters Deliver Precision Beam Control for Demanding Optical Applications

Wednesday, February 21, 2007 by Agilent

Agilent Technologies Inc. (NYSE: A) today announced (See Press Release) that its new family of high-performance thin-film beamsplitters designed to provide precision beam control is now available. Agilent’s polarizing, non-polarizing and wavelength beamsplitters in multiple geometries meet wide variety of application requirements. The new Agilent beamsplitters address the need for highly accurate beam control in the aerospace/defense, vision systems, nanotechnology measurement, homeland security and biotech instrumentation markets.